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This news article was originally written in Spanish. It has been automatically translated for your convenience. Reasonable efforts have been made to provide an accurate translation, however, no automated translation is perfect nor is it intended to replace a human translator. The original article in Spanish can be viewed at Medición automática del acabado superficial en MMC
Renishaw Incorporates the option of probe to his system of measurement REVO

Automatic measurement of the superficial finishing in MMC

Editorial Interempresas02/01/2012

2 January 2012

Probe rugosimetro for REVO.

Data of rugosidad of high quality

Like a totally integrated cheese cheese option in the system of measurement of 5 axles REVO, the users of the probe of superficial finishing SFP1 will benefit of a wide variety of powerful algorithms that will increase the speed of inspection and the flexibility.

The probe incorporates an axis C, that combined with the infinite capacity of positioning of the cabezal of measurement REVO and an orientation of the support of palpador, allows to orient the tip of the probe in any angle automatically, to adapt it to the piece, ensuring the highest quality in the data purchased. The probe SFP1 supplies with two palpadores special, the palpador straight SFS-1 and the palpador acodado SFS-2, installed on the system of rack modulate (MRS) of the system REVO. The selection of the palpador realises from the program of measurement, this flexibiliza the access to the elements to measure in the piece, with the reliability of a methodology CNC totally automated.

The probe of superficial finishing SFP1, a probe of slide with a palpador of diamond with tip of 2 micras of radius, allows to send values of Ra, RMS and data in the rough to the application of software of metrology, through the software UCCServer of Renishaw by means of the protocol I++ DME. The data in the rough can treat later by means of packages of software of analysis of surfaces, to obtain some more detailed reports.

Palpador acodado Of superficial finishing in the device
Palpador acodado Of superficial finishing in the device.

Calibrated automatic of the probe rugosímetro

The calibrated of the sensor is also automatic and executes from the software of the MMC. The new device pattern of calibrated of the rugosidad (SFA) mounts on rack MRS and measures using the probe SFP1. Afterwards, the software adjusts the parameters of the probe in accordance with the value calibrated by means of the device pattern.

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