This news article was originally written in Spanish. It has been automatically translated for your convenience. Reasonable efforts have been made to provide an accurate translation, however, no automated translation is perfect nor is it intended to replace a human translator. The original article in Spanish can be viewed at Tecmicro presenta el nuevo rugosímetro-perfilómetro Surfcom 2000 en la BIEMH 2010
Tecmicro presents the new roughness-perfilometer Surfcom 2000 at BIEMH 2010
15/04/2010
April 15, 2010
The new roughness-perfilometer Surfcom 2000 Carl Zeiss Tecmicro presented at the 2010 BIEMH is equipped with a modern PC, operating system Windows NT and the all-inclusive programme of measurement and evaluation, sometimes. He is characterized by the absence of vibrations, due to its linear motor without bearings (patented).
High-efficiency, a single measure allows to analyse the profile and roughness. It is equipped with a high-resolution Laser Interferometer, has a CNC program which memorizes the first step to perform repeatedly and provides a linear precision. The route is 100 (optional 200 mm).
Roughness-perfilometer consists of a motorized column of 450 mm in height (options of 250-600 mm). The profile types are R, P, W, WC, Wec, DIN 4776, CNOMO. The parameters of roughness are all of the standards DIN, ISO, JIS.
The new roughness-perfilometer Surfcom 2000.
