This news article was originally written in Spanish. It has been automatically translated for your convenience. Reasonable efforts have been made to provide an accurate translation, however, no automated translation is perfect nor is it intended to replace a human translator. The original article in Spanish can be viewed at Metromeet 2008 pone de manifiesto la relevancia del aumento de la precisión en la metrología

METROMEET 2008 highlights the relevance of the increase in accuracy in metrology

Drafting MU25/04/2008

April 25, 2008

METROMEET 2008, 4th International Conference on Industrial Dimensional Metrology took place in Bilbao on 21 and 22 February, confirming its commitment with the international scientific community in the sector of industrial dimensional metrology.

Professionals there gathered, not only expressed satisfaction with the high quality and practicality of the contents presented but also to the magnitude of the cast of experts to Metromeet brought together as speakers. This meeting, received visitors from different areas such as nanotechnology, software development, aerospace and automotive, among others.

Also, attendees had the opportunity to witness demonstrations of machines and systems of measurement in situ as the machine of measurement with the company Trimek optiscan.

The Conference was sponsored by the Innovalia Association, Lighthouse, AAT and Renishaw. The opening ceremony was presided over by Izaskun Artetxe, representative of the Dept. of innovation and economic promotion of the Diputación Foral de Bizkaia, partner also in this edition.

During the Panel discussion that preceded the conclusion of the event, experts of benchmark as Chris Evans, of the Corporation Zygo and Maurizio Ercole, President of IACMM (International Association of manufacturers of CMMs) agreed in pointing out that events like Metromeet should be an unmissable annual event for professionals of metrology, and encouraged all the present to engage in spreading the existence of this forum at the global level.

After the Conference, Jesus de la Maza; the Innovalia Association President, presented the award to the best presentation Chris Evans by his explanation on the importance of the increase in accuracy in metrology and the manufacturing processes, but not before convening the next edition of the 2009 attendeesto be held on 19 and 20 March.

During the two days of Conference, Metromeet 2008 brought together nearly 100 professionals and experts from 11 different countries, who could enjoy 2 keynotes and keynote lectures, 1 special lecture or special presentation, tutorials 2 and 22 presentations divided into 6 thematic tracks.