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Tecmicro presenta el nuevo rugosímetro-perfilómetro Surfcom 2000 en la BIEMH 2010Tecmicro presents the new roughness-perfilometer Surfcom 2000 at BIEMH 2010
April 15, 2010
The new roughness-perfilometer Surfcom 2000 Carl Zeiss
Tecmicro presented at the 2010 BIEMH is equipped with a modern PC, operating system Windows NT and the all-inclusive programme of measurement and evaluation, sometimes. He is characterized by the absence of vibrations, due to its linear motor without bearings (patented).
High-efficiency, a single measure allows to analyse the profile and roughness. It is equipped with a high-resolution Laser Interferometer, has a CNC program which memorizes the first step to perform repeatedly and provides a linear precision. The route is 100 (optional 200 mm).
Roughness-perfilometer consists of a motorized column of 450 mm in height (options of 250-600 mm). The profile types are R, P, W, WC, Wec, DIN 4776, CNOMO. The parameters of roughness are all of the standards DIN, ISO, JIS.
The new roughness-perfilometer Surfcom 2000.