METROMEET 2007 certifies the commitment to the industrial dimensional metrology

During the two days of Conference, Metromeet 2007 gathered nearly 100 professionals and experts from 11 different countries, who were able to enjoy two keynote talks, a special paper, two tutorials and 25 presentations divided into six thematic sections. The Conference, sponsored by Innovalia and Renishaw, counted among its attendees with the presence of Ricardo Barainka, who came on behalf of the Dept. of innovation and economic promotion of the Diputación Foral de Bizkaia, partner also in this third edition.

During the Panel discussion that preceded the conclusion of the event, experts from international reference as Dietrich Imkamp of the company Carl-Zeiss and Maurizio Ercole, President of IACMM (International Association of manufacturers of CMMs) coincided in pointing out that events like Metromeet should be an unmissable annual event for professionals of metrology, and encouraged all the present to engage in spreading the existence of this forum at the global level.

Also in this third edition, the Technical Committee of Metromeet decided to reward the paper better valued during the Conference, and was awarded the award for Eberhard Manske, the University of Ilmenau in Germany.

Finally, Jesus Maria de la Maza, President of Innovalia, declared closed the 3rd Edition of Metromeet, to be held in the spring of 2008 but not before placing participants in the 4th Edition.