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This news article was originally written in Spanish. It has been automatically translated for your convenience. Reasonable efforts have been made to provide an accurate translation, however, no automated translation is perfect nor is it intended to replace a human translator. The original article in Spanish can be viewed at Carl Zeiss inaugura un laboratorio de metrología para medir micras y nanómetros

Carl Zeiss launches a metrology laboratory for measurement of Micron and nanometer

30/04/2009

April 30, 2009

Carl zeiss has recently opened in Oberkochen (Germany) a new metrology laboratory equipped with cut-off machines range, where it will be possible to measure Micron and nanometer with maximum precision. As a reference laboratory, its main function will be calibrate machines Zeiss measurement, patterns and measurements for external customers. This laboratory will also be a demonstration room for ultra precision equipment. The specialists working there with the best machines developed by Carl Zeiss and under very special conditions. The temperature of the laboratory, controlled by its own air conditioning system, should not deflect more than 0.1 ° ideal temperature of 20 ° Celsius. The laboratory of metrology in its entirety has been credited each year by DKD (German calibration service) as a center of measurement traceability.

A Zeiss UPMC Ultra coordinate measurement machine is used for calibrations and measurements of high precision has an uncertainty of a few tenths of micra.

Calibration of the F25 the pattern multi-esferas-1
Calibration of the F25 the pattern multi-esferas-1.
The latest three-dimensional implanted in the laboratory has been a Carl Zeiss F25. This machine is used in the measurement of components of micro-sistemas, which has with nanometer accuracy. Its structure kinematics of maximum performance, combined with a ultrapreciso measurement system, achieve an uncertainty of measurement under the 250 nanometers and with a resolution of only 0.25 nanometres.

The laboratory also has a perfilometer-roughness of high-end Surfcom 5000, with a system of probe by Interferometer laser that offers a resolution of just 0.30 nanometers.

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Carl Zeiss Iberia, S.L.

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