METROLOGÍA Y CALIBRACIÓN DE HERRAMIENTAS REFERENCIAS [1] TAKAYA, Y. Strategic Vision for Smart Machining Tool and Measuring Instrument. [2] Boeckmans, B., Tan, Y., Welkenhuyzen, F., Guo, Y., Dewulf, W., & Kruth, J. P. (2015). Roughness offset differences between contact and non-contact measurements. In Proceedings of the 15th international conference of the European society for precision engineering and nanotechnology (pp. 189-190). [3] https://www.powerdata.es/big-data Visitada el 16/10/2021 [4] Castelo-Branco, I.; Cruz-Jesus, F.; Oliveira, T. Assessing Industry 4.0 readiness in manufacturing: Evidence for the European Union. Comput. Ind. 2019, 107, 22–32. [5] Varshney, A., Garg, N., Nagla, K. S., Nair, T. S., Jaiswal, S. K., Yadav, S., & Aswal, D. K. (2021). Challenges in Sensors Technology for Industry 4.0 for Futuristic Metrological Applications. MAPAN, 1-12. [6] https://www.ogpuk.com/news/industry-4-0-futuremetrology/ Visitada el 12/10/2021 [7] TAKAYA, Y. Strategic Vision for Smart Machining Tool and Measuring Instrument. [8] M. Compare, P. Baraldi and E. Zio, Challenges to IoTEnabled Predictive Maintenance for Industry 4.0, IEEE Internet of Things Journal, 7, 5, 4585–4597, 2020. [9] Weckenmann, A., Jiang, X., Sommer, K. D., Neuschaefer-Rube, U., Seewig, J., Shaw, L., & Estler, T. (2009). Multisensor data fusion in dimensional metrology. CIRP annals, 58(2), 701-721. [10] Ministry of Economy, Trade and Industry, Ministry of Health, Labor and Welfare, Ministry of Education, Culture, Sports, Science and Technology, 2017 White Paper on Manufacturing Industries Overview; FY2016 Promotion measures of core manufacturing technology (Overview), (2017). [11] Villarraga-Gómez, H., Herazo, E. L., & Smith, S. T. (2019). X-ray computed tomography: from medical imaging to dimensional metrology. Precision Engineering, 60, 544-569. [12] L. De Chiffre, S. Carmignato, J.-P. Kruth, R. Schmitt, A. Weckenmann, Industrial applications of computed tomography, CIRP Annals – Manufacturing Technology, Vol.63/2, (2014), 655-677. [13] Khosravani, M. R., & Reinicke, T. (2020). On the use of X-ray computed tomography in assessment of 3D-printed components. Journal of Nondestructive Evaluation, 39(4), 1-17. [14] Technical guideline (draft) VDI/VDE 2630, Computed tomography in dimensional measurement, Part 1.1. Basics and definitions (2007), Part 1.2. Influencing variables on measurement results and recommendations for computed tomography dimensional measurements (2008) and Part 1.4. Measuring procedure and comparability (2008) [15] Runje, B., Horvatic Novak, A., Orosnjak, M., & Belosevic, A. Influence of surface determination on CT measurement results. Matrib 2018, Materials, Tribology, Recycling. [16] Ametova, E., Probst, G., & Dewulf, W. (2018). X-ray computed tomography devices and their components. In Industrial x-ray computed tomography (pp. 69-98). Springer, Cham. [17] Aloisi V, Carmignato S, Schlecht J, Ferley E (2016) Investigation on metrological performances in CT helical scanning for dimensional quality control. In: 6th conference on industrial computed tomography (iCT), 9–12 Feb, Wels, Austria [18] VDI/VDE 2630-1.3. Computed Tomography in Dimensional Measurement - guideline for the application of DIN EN ISO 10360 for coordinate measuring machines with CT sensors. Berlin (Germany): Beuth Verlag GmbH; 2011. [19] Kruth, J. P., Bartscher, M., Carmignato, S., Schmitt, R., De Chiffre, L., & Weckenmann, A. (2011). Computed tomography for dimensional metrology. CIRP annals, 60(2), 821-842. Figura 16. Tareas principales a futuro sobre TC. sobre las mediciones TC, el efecto de la magnificación y el tamaño de foco, entre otros. Por otro lado, son necesarias metodologías de medición consistentes para que la TC pueda considerarse una tecnología precisa y fiable. Actualmente se están desarrollando metodologías trazables de inspección en componentes multimaterial, lo que supone todo un reto a día de hoy. Por otra parte, ya están siendo desarrollados e implementados en el centro procesos de inspección de ciclo cerrado mediante la automatización del proceso de medición, algo vital para avanzar en la metrología 4.0. n 42
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