This news article was originally written in Spanish. It has been automatically translated for your convenience. Reasonable efforts have been made to provide an accurate translation, however, no automated translation is perfect nor is it intended to replace a human translator. The original article in Spanish can be viewed at El Comité Técnico de Metromeet 2005 amplía los bloques temáticos de la conferencia metrológica

The Metromeet 2005 Technical Committee extends the thematic blocks of the Conference metrological

07/12/2004

on December 7, 2004

The Committee technical of the international Metromeet 2005 Conference (www.metromeet.org) has decided, after receiving samples of interest of various companies in different industrial activities and in order to accommodate the largest possible number of experts, to extend the thematic blocks which are going to cover in the papers of the Conference on Industrial Dimensional Metrology.

Also, and because of this extension, the Technical Committee of the International Conference 2005 Metromeet has decided to extend the date for the submission of papers to the Conference. In this way, researchers and industrial metrology experts who wish to share their experiences can send their proposals for presentations until January 12, 2005.

The Technical Committee, chaired by Jesus Maria de la Maza, Vice-President of IACMM (Association International of manufacturers of machines coordinate measurement), has shown his satisfaction by the reception given to this initiative in the international industry.

Thus, experts from centres of Germany, Canada, Denmark and Spain metrological have confirmed their presence at the International Conference of metrology Industrial Dimensional Metromeet 2005, which will take place at the Euskalduna Palace in Bilbao on 7 and 8 April 2005.

Also professional of the International Committee of the ISO standards, the Committee of dimensional metrology of AENOR, IACMM (Association International of machines of measurement for coordinates), EMVA (European Association of vision machines) or AUKOM (European Association for the diffusion of the Metrology) participate in Metromeet 2005He is born with the objective of becoming one of the most important metrology Industrial congresses in Europe.

Metromeet 2005, organized by the Innovalia Association, aims to publicize the latest technological advances in metrology and become a forum for discussion on its evolution in a changing industry. To this end, special attention to such factors as the new digital and optical developments or European and international policy will be provided. This way, the event will provide professionals in the sector with new working methods and ways to improve industrial processes and the productivity of your company.